MIL-DTL-83538D
4.5.2.1.4 Noncompliance. If a sample fails to pass group C inspection, the manufacturer shall take
corrective action on the materials or processes or both, as warranted, and on all units of product which
are to be corrected and which were manufactured with essentially the same materials and processes,
and which are considered subject to the same failure. Acceptance and shipment of the product shall be
discontinued until corrective action acceptable to the qualifying activity has been taken. After the
corrective action has been taken, group C inspection shall be repeated on additional sample units (all
inspections, or the inspection which the original sample failed, at the option of the qualifying activity).
Groups A and B inspections may be reinstituted; however, final acceptance shall be withheld until the
group C reinspection has shown that corrective action was successful. In the event of failure after
reinspection, information concerning the failure shall be furnished to the cognizant inspection activity and
the qualifying activity.
4.5.3 Failures of groups A, B, or C. Lots which fail groups A, B, or C and are not resubmitted for
testing or failed resubmission shall not be shipped and the "JAN" marking shall be removed within 30
days.
4.6 Methods of inspection.
4.6.1 Visual and mechanical examination. Connectors, accessories, and piece parts shall be visually
and mechanically examined to ensure conformance with the specification and the applicable military
standards (see 1.1.1, 3.1, 3.3, 3.4, 3.5, and 3.41). The contractor may use in process controls to satisfy
these requirements.
4.6.1.1 Test methods. The following identified tests and methods assure connector integrity within
typical operating conditions and applications. Alternate commercial industry standard test methods are
allowed when determined to provide equivalent results; however when an alternate method is used, the
qualifying activity must be notified prior to the performance of the test. The test methods described
herein are proven methods and shall be the referee methods in case of dispute.
4.6.1.2 Qualification test fixture for MIL-DTL-83538/11 buffer plug. The MIL-DTL-83538/11
buffer plug shall be subjected to the test methods specified in MIL-DTL-83538 as applicable, using the
test fixture described on figure 8, or a suitable mating missile receptacle. A failure of the qualification test
fixture, or the mating missile receptacle, does not constitute a failure of the MIL-DTL-83538/11 buffer
plug.
4.6.2 Maintenance aging. Connectors shall be tested in accordance with test procedure
EIA-364-24. The following detail shall apply: Installing/removal tool shall be in accordance with
MIL-I-81969/14. A minimum of 20 percent of each contact size of each connector shall be tested. There
shall be no lubricant used during this test (see 3.6).
4.6.3 Temperature cycling. Mated connectors shall be subjected to test procedure EIA-364-32, test
condition V, 5 cycles, except that steps 2 and 4 shall be of 2 minutes maximum duration. The
temperature of step 1 shall be -65°C +0°C -5°C, and the temperature of step 3 shall be +175°C +5°C -
0°C. The time for steps 1 and 3 shall be one hour duration for each step. A suitable fixture shall apply the
mating force specified in 3.4.7.2. During the last 30 minutes of step 1 and step 3, all high current contact
paths shall be subjected to a continuous current of 12.0 amperes (see 3.7).
4.6.4 Coupling. Mating connectors shall be coupled and uncoupled. The forces or torques which must
be applied to facilitate full coupling and uncoupled shall be measured and recorded (see 3.8).
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