MIL-DTL-83538D
4.6.19 Shell to shell conductivity. Mated connectors shall be subjected to the test specified in test
procedure EIA-364-83. A suitable fixture shall apply the holding force specified in 3.4.7.2 to hold the
connector pair together (see 3.23).
4.6.20 Humidity. Wired, mated connectors shall be subjected to the humidity test specified in test
procedure EIA-364-31. The following details and exceptions shall apply (see 3.24):
a.
Test condition, method IV.
b.
The mated connectors shall be mounted in a vertical position.
c.
Step 7a shall be performed during the last 5 cycles.
d.
Three hours minimum after the start of step 7a during the final cycle and while the connectors are
still subjected to high humidity, the insulation resistance shall be measured when the chamber
temperature reaches +20°C, - 5°C and condensation is observed on the connector.
e. For qualification testing, insulation resistance readings shall be made on a minimum of 50 percent
of the circuits. Outer circuits shall be measured to the connector shell.
f. A suitable fixture shall apply the holding force specified in 3.4.7.2 to hold the connector pair
together.
4.6.21 Shell spring finger forces. Plugs shall be completely mated and unmated 10 times with
counterpart receptacles less coupling pins (if applicable) and inserts. On the mating of the first cycle, the
forces necessary to engage the connectors shall be within the values specified in 3.25. On the unmating
of the last cycle, the forces necessary to separate the connectors shall be within the values specified in
3.25.
4.6.22 EMI shielding. Not applicable to the MIL-DTL-83538/11 buffer plug (see 3.26).
4.6.22.1 EMI shielding (from 100 Hz to 1 GHz only). The EMI shielding effectiveness of mated
connectors with EMI backshells (backshells may be soldered to the connector) shall be measured in a
triaxial radio frequency leakage fixture as specified on figure 10. The EMI leakage from the conductor
inside the connector in the same inner coaxial line into the outer coaxial line shall be measured at the
frequencies specified in table III within a frequency accuracy of ±5 percent. The level of detected signal
power shall be indicated by a tunable radio frequency field intensity meter isolated from the test circuit by
a 3 to 10 dB pad. Care shall be taken to ensure that the signal is a result of EMI leakage from within the
mated connector and not due to a faulty termination inside the fixture. All terminations inside the fixture,
whether to the EMI backshells or between internal conductors, shall have a leakage at least 10 dB less
than the test requirements.
The signal source shall be set to the desired frequency. The signal shall be fed through a 3 to 10 dB
isolation pad to a parallel circuit consisting of a coaxial switch (DPDT) so connected that the signal can
be manually or electronically fed alternately to the fixture and to a variable 100 dB reference attenuator.
The attenuator shall be adjustable in 1 dB steps and calibrated to ± 3 dB.
a. The inserts may be removed from the connectors under test or the contacts removed and a hole
drilled through the inserts to accommodate a center conductor of suitable geometry to provide a
good 50 ohms impedance match with the inside diameter of the mated connector shells and EMI
backshells. Tapered transition may be used to provide a means of changing diameters without
introducing significant discontinuities in the line. The maximum VSWR in the inner coaxial line
shall be 1.5. The outer shell of the test fixture shall be so constructed as to provide a good 50
ohms impedance match with the outside diameter of the mated connector shells, coupling ring,
and EMI backshells. The maximum VSWR of the outer coaxial line shall be 1.5.
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