MIL-DTL-55302/121B
Sampling plan: Group "B" statistical sampling and inspection shall be in accordance with table I.
TABLE I. Lot and sample size.
Lot size
Sample size
2 to 13
100%
14 to 1200
13
1201 to 35,000
50
35,001 to 500,000
80
500,001 and over
125
Vibration: Test condition III of EIA-364-28 shall apply.
Shock: Test condition A of EIA-364-27 shall apply.
Keys: When required, are installed by user. See MIL-DTL-55302/124 for further details and installation
instructions.
Mating plug: Shall conform to MIL-DTL-55302/120.
Group A testing:
High temperature contact resistance: Sample connectors from each lot shall be subjected to a
contact resistance test at 10 milliamps and 120 ± 5°C. The contact dc resistance shall be 10
milliohms maximum per mated pair contacts.
Test contacts user option: When required by the user purchase order, a quantity of 4 contacts per
connector or 30 contacts per shipment, whichever is less, with terminal wires attached shall be
supplied separately for plating and crimp inspection by the buyer. These contacts shall be from the
same plating and crimp lots as those installed in the connectors delivered.
QPL testing and periodic retesting:
X-ray: Representative sample connectors shall be X-rayed by the wet film process to produce 1 to 1
contact images. Two different lateral images shall be taken at ± 26.5° incident angles so as to view
both rows of contacts simultaneously in each image. The developed film shall be inspected at
10 power minimum magnification for proper pin bundle and terminal wire insertion depth and for the
presence of uncrimped or loose strands.
High temperature contact resistance: Representative sample connectors shall be tested as in
group A, high temperature contact resistance.
Contact inspection: Representative sample contacts with terminal wires crimped shall be tested for
plating thickness, plating porosity, crimp impression penetration and crimp pull strength.
Part or Identifying Number (PIN): M55302/121-01.
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