MIL-DTL-3643B
3.8 Workmanship. Connectors and associated fittings shall be processed in such a manner as to be
uniform in quality and shall be free from sharp edges and burrs, except where sharp edges are required
for mechanical or electrical reasons. All solder joints shall be thoroughly cleaned.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as
follows:
a. Component-materials inspection (see 4.2).
b. Conformance inspection (see 4.3).
4.2 Component-materials inspection. Component-materials inspections shall consist of verification that
the component materials listed in table I, used in fabricating the connectors and associated fittings, are in
accordance with the applicable referenced specifications or requirements prior to such fabrication.
TABLE I. Component materials inspection.
Requirement
Applicable specification
Component material
paragraph
Brass
3.2.1
ASTM B16, ASTM B36, ASTM B121, or ASTM B124
Copper beryllium
3.2.2
ASTM B194, ASTM 196, or ASTM B197
Phosphor bronze
3.2.3
ASTM B139
Plastic
3.2.4
L-P-516
Silicone rubber
3.2.5
A-A-59588
Silver solder
3.2.6
QQ-B-654
Flux
3.2.6.1
O-F-499
Soft solder
3.2.7
J-STD-006
Polytetrafluoroethylene
3.2.8
ASTM-D1710
4.3 Conformance inspection.
4.3.1 Inspection conditions. Unless otherwise specified herein, all inspections shall be made at room
ambient temperature, relative humidity, and pressure.
4.3.1.1 Inspection lot. An inspection lot, shall consist of all the connectors and associated fittings of the
same type designation, produced under essentially the same conditions, and offered for inspection at one
time.
4.3.1.2 Resubmitted lot. If an inspection lot is rejected, the supplier may replace it with a new lot,
rework it to correct the defects, or screen out the defective units, and submit it again to acceptance
inspection. Resubmitted lots shall be kept separate from new lots and shall be clearly identified as
resubmitted lots.
4.3.1.3 Group A inspection. Group A inspection shall consist of the examinations and tests specified in
table II, and shall be made on the same set of sample units.
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