MIL-DTL-83538D
a. The high bandwidth 1 contact shall be terminated to RG316 cable.
b. The high bandwidth 1 contact (SAE-AS39029/103) shall be tested from 20 Hz to 2.0 GHz with a
50-ohm reference load.
c. For frequencies from 500 MHz to 2.0 GHz, the measured insertion loss shall not exceed
0.11 dB x F , where F is the test frequency in GHz. For frequencies below 500 MHz, the
insertion loss shall not exceed 0.12 dB.
d. For frequencies from 20 Hz to 20 MHz, the insertion loss shall not exceed 0.20 dB.
e. A suitable fixture shall apply the holding force specified in 3.4.7.2 to hold the connector pair
together.
4.6.24 Voltage standing wave ratio. Not applicable to the MIL-DTL-83538/11 buffer plug (see 3.28).
Wired, mated connectors shall be subjected to the following VSWR tests:
a. Conduct the test on a mated set of launcher receptacle, buffer plug, and store receptacle units.
b. High bandwidth 1 contacts shall be tested with RG316 cable and a 50-ohm reference load.
c. After performing a 50-ohm ±1, 1-port calibration of the vector network analyzer, set up the test
configuration on figure 12 for the connector set under test. Set the network analyzer starting
frequency at 50 MHz maximum and the stopping frequency at 2.0 GHz minimum.
d. Display the linear magnitude of the low pass impulse reflection response (time domain) on
figure 12 test setup (inverse fourier transform of the frequency domain data).
e. Gate out all reflection contributors beyond adapter 1 (see figure 12).
f. Fourier transform the gated impulse reflection response back into the frequency domain and verify
that adapter 1 VSWR is less than 1.20 over the frequency range selected in step "c".
g. Return the network analyzer to the low pass impulse response (time domain) mode and remove
the gate of step "e".
h. Remove all residual reflection contributors by centering (±1 nanosecond) a new gate at the
midpoint between the mated connector set. Set this new gate width to a value higher than 20.0
nanoseconds.
i. Fourier transform the gated impulse reflection response back into the frequency domain.
j. Verify that the displayed resulting transformed return loss (or equivalent reflection coefficient)
complies with the VSWR limits specified in 3.28.
k. A suitable fixture shall apply the holding force specified in 3.4.7.2 to hold the connector pair
together.
4.6.25 Ozone. Wired, mated connectors shall be subjected to the test specified in test procedure
EIA-364-14. A suitable fixture shall apply the holding force specified in 3.4.7.2 to hold the connector pair
together (see 3.29).
4.6.26 Fluid immersion. Connector samples shall be subjected to the test specified in test procedure
EIA-364-10 (one sample per fluid as referenced in table X). Following the fluid immersion cycles, the
connectors shall be tested for coupling force/torque as specified in 4.6.4, decoupling rate as specified in
4.6.4.3 and dielectric withstanding voltage at sea level as specified in 4.6.8.1 within 3 hours (see 3.30).
4.6.27 Retention system fluid immersion. Unmated connectors with contacts removed shall be
immersed in the fluids listed in table X (one sample per fluid) for 2 hours at room temperature. After
removal, excess fluid shall be drained from the connectors for 4 hours and the contacts reinstalled.
Following the test, the connectors shall be subjected to contact retention as specified in 4.6.14
(see 3.30.1).
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