MIL-PRF-55339C
4.5.5 Mating characteristics (see 3.8). After insertion of the specified oversize pin the specified
number of times (see 3.1), the contact to be tested shall be held rigid by means of a suitable jig or
fixture, or a qualified mating connector with the approval of the qualifying activity. A gauge containing
the test pin or test ring and a suitable force indicating dial shall be aligned to within 0.004 TIR of any
plane passing through the axis of the contact under test. Engagement or withdrawal of the test pin or
test ring shall be made smoothly and at such a rate that the dial does not bounce or otherwise give a
false reading. The test pin or test ring may be chamfered to facilitate entry, but the specified
engagement length shall not include the chamfer length and the finish shall be as specified and in
accordance with ASME B46.1.
4.5.6 Permeability of nonmagnetic materials (see 3.9). The permeability of the adapter shall be
measured with an indicator conforming to ASTM A342.
112, MIL-STD-202. The following details shall apply:
Method of mounting in its normal manner in specified mounting hole (see 3.1).
a.
b.
Test condition letter. C.
c.
Procedure number. I.
Leakage rate sensitivity: 10-8 cubic centimeters per second.
d.
4.5.7.1 Leakage (pressurized) (see 3.10.1). The unmated adapter shall be mounted in its normal
manner in the specified mounting hole (see 3.1) on a closed container. The specified air pressure
(see 3.1) shall be applied to the interior of the container. The exposed portion of the adapter under
pressure shall be fully immersed in water or alcohol-water mixture and observed for 1 minute
minimum.
test condition B of MIL-STD-202. Measured between the center contact and body.
4.5.9 VSWR (see 3.12). The VSWR shall be measured in accordance with the following procedure
or a method acceptable to the Government. In the event of dispute the method outlined herein shall
be used. Diagrams for the swept frequency VSWR system check out and measurement procedures
are shown on figure 1.
In the basic measurement setup on figure 1, detector 1 provides a feedback signal to the swept RF
source in order to normalize the output signal of detector 2. The frequency-amplitude characteristics
of detectors 1 and 2 should be matched within .5 dB.
To measure VSWR several sweeps are made with the slotted line probe incrementally positioned
over at least a half wave length at the lowest frequency of interest. In this manner an X-Y display is
generated whose upper and lower envelope limits represent maximum and minimum amplitudes of
the standing wave for each frequency in the test band. A base line may be generated by making a
sweep with no input to the measurement channel amplifier. The resultant X-Y display is calibrated
according to the characteristics of the measurement channel detector and amplifier, e.g., linear,
square law, logarithmic, etc. VSWR shall be measured with each end of the adapter under test as
input.
The VSWR test system is checked out by successively terminating the slotted line with the elements
shown in steps 1, 2, and 3 sweeping the frequency over the specified test band (see 3.1). In step 1
the system VSWR shall be less than 1.02 + .004 F (F measured in GHz). In steps 2 and 3, the
system VSWR shall be as specified (see 3.1).
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