MIL-DTL-26500G
Assemblies produced at the assembly plant shall be subjected to inspection to ensure that the assembly
process conforms with that established at the qualified manufacturing plant. Quality control requirements,
including Government inspection surveillance, shall be the same as required for the qualified connector
manufacturer.
4.2 Inspection conditions. Unless otherwise specified herein, all inspections shall be performed in
accordance with EIA-364.
4.3 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to
the qualifying activity (see 6.3) on sample units produced with equipment and procedures normally used
in production.
4.3.1 Qualification of additional connectors. For connectors which differ only in minor details from
those submitted for qualification in 4.3, the manufacturer's test report (4.3.5) need only provide inspection
and test data necessary to validate the differences, with information on identical features for which no
inspection or test was performed.
4.3.1.1 Group qualification. Where it can be shown that a group of connectors constitutes a design
series differing only in envelope dimensions, qualification of the entire series can be accomplished at the
discretion of the qualifying activity by submitting the largest and smallest shell sizes to, and successfully
passing, this specification. Proof of design similarity shall take into account, but not necessarily be limited
to, the following considerations:
a.
That shell couplings are identical.
b.
That component materials are identical.
c.
That contacts are identical.
d.
That contact spacing is identical, or at least that connector samples subjected to actual testing
include those exhibiting the closest contact to contact and contact to shell spacing.
4.3.2 Sample size and inspection routine. Samples of each item for which qualification is desired shall
be tested in the sequence specified in table VI. Each connector subjected to qualification testing shall be
provided with a counterpart connector for those tests requiring mating assemblies. The counterpart
connectors provided for this purpose shall be new, previously qualified connectors or new connectors
submitted for qualification testing. Manufacturers not producing mating connectors shall submit data
substantiating that tests were performed with approved counterpart connectors. Specific details on
preparation of samples shall be as follows.
4.3.2.1 Selection of samples.
4.3.2.1.1 Connector samples (classes R, E, and G). Two mating pairs of connectors, with insert
arrangements in the densest configuration in each shell size for which qualification is desired shall be
provided. Separate samples are required for each class. Manufacturers seeking qualification for less
than nine shell sizes shall select a minimum of 16 mating pairs.
a. One sample of each shell size shall have pin contacts in the receptacle and socket contacts in the
plug. The other sample shall have socket contacts in the receptacle and pin contacts in the plug.
b. The samples shall be divided equally into three groups and subjected to the tests specified in
groups I, II, III of table VI in the sequence specified.
Group I - eight mating pairs.
Groups II and III - the remaining connectors shall be divided equally between the two groups.
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