MIL-DTL-27434B
TABLE IV. Inspection level (group A).
Sample size
Lot size
all
1
to
15
20
16
to
280
47
281
to
1,200
53
1,201
to
3,200
68
3,201
to
10,000
77
10,001
to
35,000
96
35,001
to
150,000
119
150,001
to
500,000
143
500,001
or more
4.3.1.3 Group B inspection. Group B inspection shall consist of the inspections specified in table V in
the order shown, and shall be made on sample units which have been subjected to and passed the
Group A inspection. Connectors having identical piece parts may be combined for lot purposes and shall
be in proportion to the quantity of each PIN numbered connector produced.
4.3.1.3.1 Sampling plan. A sample of parts shall be randomly selected in accordance with table VI. If
one or more defects are found, the lot shall be screened for that particular defect and defects removed.
After screening and removal of defects, a new sample of parts shall be randomly selected and subjected
to all tests in accordance with table VI. If one or more defects are found in the second sample, the lot
shall be rejected and shall not be supplied to this specification. Group B inspection shall be performed in
any order acceptable to the Government.
TABLE V. Group B inspection.
Examination or test
Requirement
Method
paragraph
paragraph
Physical dimensions
4.4.2
3.3.1
(terminations)
Gage test for contacts
4.4.3
3.1 and 3.3.1.1
8
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