MIL-DTL-24308 Connectors, Electric, Rectangular, Nonenvironmental, Miniature, Polarized Shell, Rack And Panel, General Specification ForThis specification covers the requirements for nonenvironmental, polarized shell, miniature, rack and panel connectors having pin and socket, crimp \(removable\), solder \(nonremovable\), or insulation displacement \(nonremovable\) contacts with rigid or float mounting, designed for -55 degrees C to +125 degrees C operating temperature range.

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MIL-DTL-24308G

4.5.11 Contact resistance (nonremovable contacts)(see 3.5.9). Contacts shall be tested in accordance with test

procedure EIA-364-06. A minimum of four mated contacts or 20 percent of the mated contacts, whichever is greater,

shall be measured in each connector being tested. The following details apply:

Wire size: As specified (see 3.1).

Preparation: Connectors mated.

Test current: Maximum contact current rating (see 3.5.9).

Test circuits for nonremovable and classes H and K connectors shall be as shown in procedure 06. Test

circuit for IDC connectors shall be as shown on figure 3.

4.5.11.1 Classes H and K pin contacts. Classes H and K pin contacts shall be mated with counterpart copper

based alloy socket contacts for the test specified in 4.5.11.

OPTIONAL

POW ER

SUPPLY

FIGURE 3. Contact resistance test circuit for IDC connectors.

4.5.12 Contact engagement and separation forces (see 3.5.10). Contact engagement and separation forces shall

be tested in accordance with test procedure EIA-364-37. Four contacts or 20 percent of the contacts, whichever is

greater, shall be measured in each connector being tested. The following details apply:

Insert and separate a maximum diameter pin in and from each socket contact, then insert and remove a

minimum diameter pin in the same sockets. During separation of the minimum diameter test pin, the

minimum separation force shall be as specified in 3.5.10.

Insert and separate a maximum diameter pin in and from each socket contact three times. During the third

cycle, the engagement force shall be as specified in 3.5.10.

4.5.13 Temperature cycling (classes G, H, and N) (see 3.5.11). Unmated connectors shall be tested in accordance

with test procedure EIA-364-32, condition I, 5 cycles, except that the maximum temperature shall be as specified in

table VIII. At the completion of the last cycle, the connectors shall be returned to room temperature for further

examination and shall meet the requirements specified in 3.5.11.

4.5.13.1 Temperature cycling (classes D, K, and M) (see 3.5.11.1). Mated connectors shall be tested in

accordance with test procedure EIA-364-32, condition I, 5 cycles, except that the maximum temperature shall be as

specified in table VIII. At the completion of the last cycle, the connectors shall be returned to room temperature for

further examination and shall meet the requirements specified in 3.5.11.1.