MIL-DTL-83413C
b. After completion of the test, the detent action test of 4.7.2 and the contact resistance test of
4.7.7.1 shall be performed.
4.7.16 Humidity (see 3.5.15). The test shall be performed in accordance with test procedure 31 of EIA-
364. The following conditions shall apply:
a.
Test condition: Type II up to but excluding step 7a.
b.
Test preparation: Connectors shall be unmated.
c.
Test apparatus shall be used for receptacles (see 4.2.1).
d.
After completion of the test, the clamp release force test of 4.7.9, the contact resistance test of
4.7.17 Temperature cycling (see 3.5.16). The test shall be performed in accordance with test procedure
32 of EIA-364. The following conditions shall apply:
a.
Test condition: Condition I, 100 cycles.
b.
Test preparation: Connectors shall be unmated.
c.
Test apparatus shall be used for receptacles (see 4.2.1).
After completion of the test, the clamp release force test of 4.7.9, the contact resistance test of
d.
4.7.18 Drop (see 3.5.17). The grounding clamp connector shall be dropped onto solid concrete from a
height of 10 feet with a random free fall. The clamp connector shall be dropped 25 times. After completion
of the test, the clamp release force test of 4.7.9 and the clamp connector resistance test of 4.7.7.2 shall
be performed, as applicable.
4.7.19 Altitude-low temperature (see 3.5.18). The test shall be performed in accordance with test
procedure 105 of EIA-364. The following conditions shall apply:
a. Test apparatus shall be used for receptacles (see 4.2.1).
b. After completion of the test, the contact resistance test of 4.7.7.1, the detent action
applicable.
4.7.20 Dust (see 3.5.19). The test shall be performed in accordance with method 110 of
MIL-STD-202. The following conditions shall apply:
a. Test apparatus shall be used for receptacles (see 4.2.1).
b. Test preparation: Connectors shall be unmated.
c. After completion of the test, the clamp release force test of 4.7.9, the contact resistance test of
4.7.21 Fluid immersion (see 3.5.20). The test shall be performed in accordance with test procedure 10
of EIA-364. The following conditions shall apply:
a. Test apparatus shall be used for receptacles (see 4.2.1).
b. Test preparation: Receptacles shall be unmated.
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