MIL-DTL-22992G
4.5.2 Group A inspection. Connectors shall be subjected to the individual tests shown in
table IX or group A inspection. The documentation and standard test conditions of EIA-364 do not apply.
TABLE IX. Group A inspection.
Inspection 1/ 2/
Requirement paragraph
Test paragraph
Visual and mechanical examination
1/ One hundred percent inspection.
2/ The contractor may use in-process controls for this requirement.
4.5.2.1 Visual examination. Each connector shall be visually examined for completeness,
workmanship and identification requirements. Attention shall be given to those assemblies that require a
gasket to determine the condition of that gasket. Gaskets missing, twisted, buckled, kinked or damaged
in any way shall be cause for rejection.
4.5.3 Group B Inspection. Group B inspection shall consist of the applicable tests specified in
table X, and shall be made on sample units which have been subjected to and have passed the group A
inspection. For group B, the documentation and standard test conditions of EIA-364 do not apply (see
4.5.2.2).
TABLE X. Group B inspection.
Inspection
1/
Requirement paragraph
Test paragraph
Visual and mechanical examination
Contact engagement and separation forces 2/
Insulation resistance (ambient temperature) 3/
Dielectric withstanding voltage
1/ The contractor may use in-process controls for this requirement.
2/ Applicable to class C only.
3/ Test between two adjacent contacts and between two peripheral contacts and the shell.
4.5.3.1 Group B inspection of adapters, protective covers and stowage receptacles and cable grips.
Manufacturers of adapters, protective covers, stowage receptacles, and cable grips or manufacturers
who are not producing mating connectors shall submit data substantiating that group B tests of those
items were performed with an appropriate number of qualified electrical connectors as specified in 4.4.2,
and in accordance with the applicable requirements of this specification and in the order shown in table X.
4.5.3.2 Sampling plan. A sample size shall be randomly selected in accordance with table XI. If one
or more defects are found, the lot shall be rescreened and defects removed. A new sample as specified
in table XI shall then be randomly selected. If one or more defects are found in the second sample lot,
the lot shall not be supplied to this specification.
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