MIL-DTL-25516F
4.7 Methods of inspection.
4.7.1 Visual and mechanical examination. Connectors shall be inspected to verify that the materials,
screw threads, physical dimensions, marking, and workmanship are in accordance with the applicable
requirements.
4.7.2 Insulation resistance. The connector shall be measured for insulation resistance between the
center conductor and connector body, or inner and outer conductors of wired and mated assemblies, at
500 volts dc in accordance with test procedure 021 of EIA 364 (see 3.6.1).
4.7.3 Dielectric withstanding voltage. A dielectric withstanding voltage test for both mated and unmated
connectors shall be conducted in accordance with test procedure 020 of EIA 364. The test voltage shall
be in accordance with table III (see 3.6.2).
4.7.4 Contact resistance. Electrical resistance of mated connector inner ands outer contracts shall be
determined separately in accordance with test procedure 023 of EIA 364. Test current shall be in
accordance with table IV (see 3.6.3).
4.7.4.1 Inner contacts. A test current as required by table IV shall be applied to the ends of the wire
attached to the mated contacts. One test probe shall be placed on each end of the mated contact pair and
the millivolt drop shall be measured by means of a suitable instrument.
4.7.4.2 Outer contacts. Test as above, except that the current is applied to the coaxial shield of the
attached cables, and the voltage test probes placed on each end of the mated connector pair.
4.7.5 Low signal level contact resistance. When tested in accordance with test procedure 023 of
EIA 364, the low signal level contact resistance of each mated pair shall not exceed the applicable values
specified in table V (see 3.6.4).
4.7.6 Contact engagement and separation forces. When tested in accordance with test procedure 037
of EIA 364, the force levels shall comply with 3.6.5. A 0.0390 +.0000 -.0001 inch diameter pin shall be
inserted and removed from each socket contact. The engagement forces shall be measured during
insertion. A 0.0370 +.0001, -.0000 inch diameter pin shall be inserted and removed from each contact and
the separation force shall be measured during removal. Except as noted herein, the pins shall conform to
SAE-AS31971. The insertion depth shall be 0.125 inch minimum.
4.7.7 Resistance to test probe damage (see 3.6.6). Socket contacts shall be tested in accordance with
test procedure 025 of EIA 364. The following details and exceptions shall apply:
a.
The contact shall be locked into a connector.
The test probe shall have a diameter of 0.038 ±0.001 inch.
b.
While inserted, a bending moment of .5 inch-pound ±10 percent shall be applied to the probe.
c.
d.
After the test, the contacts shall meet the requirements of 3.5.5.
The NO-GO test pin (0.044 ± .001 inch diameter) shall be applied with a force of 5 ±1 pounds.
e.
4.7.8 Contact retention (see 3.6.7). An unmated connector assembled with its proper cable shall be
tested in accordance with test procedure 029 of EIA 364. The following details shall apply:
a. The axial load shall be 10 pounds.
b. The load shall be applied from the mating end.
c. The axial displacement shall be in accordance with 3.6.7.
17
For Parts Inquires submit RFQ to Parts Hangar, Inc.
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business