MIL-DTL-83513G
3.5.6 Contact resistance. Contact resistance for mated pairs of pin and socket contacts including wire
shall be as required in table III when tested as specified in 4.5.8. A test current of less than 2.5 amperes
is permitted for group B testing only, with the corresponding millivolt drop changes.
TABLE III. Contact resistance .
Test
Wire
Voltage drop (mV)
Contact
Wire type
current
size
Initial
After salt
size
(amperes)
AWG
spray
24
26
2.5
65
70
SAE AS22759/11 (stranded)
maximum
maximum
24
26
2.5
75
80
SAE AS22759/33 (stranded)
maximum
maximum
DSCC drawing 04035
24
25
2.5
60
65
A-A-59551 1/
maximum
maximum
(solid)
24
24
2.5
60
65
A-A-59551 1/
maximum
maximum
(solid)
1/ Sleeving is permitted for testing purposes only.
3.5.7 Contact engagement and separation forces. Pin contacts shall conform to the forces specified in
table IV when tested as specified in 4.5.9.
TABLE IV. Contact engagement and separation forces (ounces).
Contact size
Maximum individual
Minimum individual
engagement force using
separation force using
minimum diameter test
maximum diameter test
sleeve
sleeve
24
6.0
0.5
3.5.8 Temperature cycling. There shall be no damage detrimental to the operation of the connector
after being subjected to the temperature extremes in table V when tested as specified in 4.5.10.
TABLE V. Temperature extremes.
Extremes
C
Low
-55 +0, -3
High
+125 +3, -0
3.5.9 Humidity. Connectors shall meet the applicable dielectric withstanding voltage and insulation
3.5.10 Resistance to soldering heat. When tested as specified in 4.5.12, type II connectors shall be
visually inspected and show no evidence of distortion or physical damage and shall meet the dimensional
requirements specified in 3.4.
3.5.11 Solderability. Type II contacts shall withstand the test conditions for solderability as specified in
3.5.12 Vibration. Mated connectors shall not be damaged and there shall be no loosening of parts due
to vibration. Counterpart connectors shall be retained in the mated condition and there shall be no
interruption of electrical continuity or current flow longer than 1 microsecond when tested as specified in
10
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