MIL-DTL-83513G
4.3 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to
the Government (see 6.3) on sample units produced with equipment and procedures normally used in
production. Use of alternate materials, platings and processes (see 3.3.1) shall be identified for inclusion
in the product test documentation.
4.3.1 Sample size.
4.3.1.1 Connectors. To qualify all connector sizes, samples of the connectors with the largest number
of contacts for the class and type for which qualification is desired shall be inspected. If only one class is
to be qualified, samples of six mated pairs of the largest size consisting of four samples of type I, and two
samples of type II, shall be submitted. If both class P and M connectors are being qualified at the same
time, samples of four mated pairs of the largest size in each class consisting of three samples of type I,
and one sample of type II, shall be submitted. If qualification of only one type of any class is desired,
samples of two mated pairs of each finish shall be submitted. For dielectric material, quantities and tests
shall be determined by the qualification agency. If qualification of class M, nickel-plated connectors
(intended for space using specified wire) is desired in addition to qualification of class P and M cadmium
and nickel plated connectors, two additional mated pairs (one type I and one type II connector) of the
largest size shall be submitted in addition to all other samples submitted. If the space application nickel
plated connectors are submitted in addition to other test samples not including nickel plate, samples of
four mated pairs of nickel plated connectors ( three of type I and one of type II) shall be submitted in
addition to the other samples. In addition, four samples of type II (solid wire and solder cup) shall be
tested to group V only specified in table VII.
4.3.1.2 Contacts. Individual contacts to be used in the connectors proposed for qualification shall be
subject to crimp tensile strength testing in accordance with group IV specified in table VII. Twenty contact
mating pairs for each wire type, shall be tested for qualification purposes and 10 contact mating pairs for
each particular design shall be tested for retention of qualification (see 3.4.5).
4.3.1.3 Qualification of other connector sizes. For other connector sizes only, of both class P and M,
types I and II for which qualification is desired, two completely assembled type I mating connector pairs
for each size and class shall be subjected to the tests specified in table VII. Successful qualification of
type I connectors will qualify type II. If only qualification of one type is desired, only two each additional
connectors of that type are to be submitted.
4.3.2 Inspection routine. The samples shall be subjected to the inspections specified in table VII, in the
order shown. All sample units shall be subjected to the inspections of group I. The sample shall then be
divided equally into two groups; one shall be subjected to the group II inspections, and the other shall be
subjected to the group III inspections. Group IV is for contacts only and the sample size shall be as
specified in 4.3.1.2.
4.3.3 Failures. One or more failures shall be cause for refusal to grant qualification approval.
4.3.4 Verification of qualification. To retain qualification, the contractor shall verify in coordination with
qualifying activity the capability of manufacturing products, which meet the performance requirements of
this specification. Refer to the qualifying activity for the guidelines necessary to retain qualification to this
specification. The contractor shall immediately notify the qualifying activity at any time that the inspection
data indicates failure of the qualified product to meet the requirements of this specification.
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