8 inch printed wiring boards, and for interconnections between printed wiring boards. The connectors are intended to provide a reliable connection between printed wiring and conventional wiring. The interconnector concept is intended to provide connection of printed wiring on one board to printed wiring on another board.

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MIL-DTL-21097G

4.5.2.1.4 Noncompliance. If a sample fails to pass group B inspection, the manufacturer shall notify the qualifying

activity and the cognizant inspection activity of such failure and take corrective action on the materials or processes, or

both, as warranted, and on all units of product which can be corrected and which were manufactured under essentially

the same conditions, with essentially the same materials and processes, and which are considered subject to the same

failure. Acceptance and shipment of the product shall be discontinued until corrective action, acceptable to the

qualifying activity has been taken. After the corrective action has been taken, group B inspection shall be repeated on

additional sample units (all inspections, or the inspection which the original sample failed, at the option of the qualifying

activity). Group A inspection may be reinstituted; however, final acceptance and shipment shall be withheld until the

group B inspection has shown that the corrective action was successful. In the event of failure after reinspection,

information concerning the failure shall be made available to the cognizant qualifying activity.

4.6 Methods of inspection.

4.6.1 Visual and mechanical examination. Connector and contacts shall be inspected to verify that the design

requirements, construction, materials, dimensions, marking, and workmanship are in accordance with applicable

requirements (see 3.1, 3.3 through 3.4.4, 3.24 and 3.28). Standard inspection measuring tools shall be used.

4.6.1.1 Test methods. The following identified tests and test methods assure connector integrity within typical

operating conditions and applications. Alternate commercial industry standard test methods are allowed; however when

an alternate method is used, the qualifying activity must be notified prior to performance of the test. The test methods

described herein are proven methods and shall be the referee method in cases of dispute.

4.6.1.2 Interchangeability. Physical configuration and dimensional measurements shall meet the requirements of 3.5

and 4.5.1 and as specified on the individual specification sheet (see 3.1).

4.6.2 Permeability (see 3.6). The permeability of the assembled connector shall be measured with an indicator in

accordance with ASTM A342/A342M.

4.6.3 Insulation resistance (see 3.14). Unmated connector assemblies shall be tested in accordance with test

procedure EIA-364-21. The following details and exceptions shall apply:

a. Points of measurement: Between individual contact pairs, and between all contacts and the body.

b. Electrification time: 1 minute.

4.6.4 Dielectric withstanding voltage (see 3.8). Unmated connectors shall be tested in accordance with test

procedure EIA-364-20. The following details and exceptions shall apply:

a. Special conditions: All contacts shall be subjected to the high potential test. They may be wired with

alternate series in contacts in a manner to test the high potential characteristics between adjacent not

opposing pairs of contacts. There shall be no insulated tubing used over the terminals during this test.

b. Magnitude of test voltage: Applicable value specified at sea level and per contact in table IV, applicable value

specified at altitude and per contact spacing in table IV for types CR and CS only.

c. Nature of potential: ac.

d. Duration of application of test voltage: 60 �10 seconds after voltage requirements is attained. Voltage

applied shall be at a rate not exceeding 500 volts per second until test voltage is attained.